SYED NASIRUDDIN, S. T. A.; MAHMOOD, A.; CHE ANI, A. I.; ABDULLAH, M. F.; MUKHTAR, N. M. A.; AHMED, N. M.; NOR IZAHAM, N. I. A COMPARATIVE STUDY OF DIFFERENT THRESHOLDING TECHNIQUES IN SEGMENTING POROUS GALLIUM NITRIDE IN FIELD EMISSION SCANNING ELECTRON MICROSCOPY IMAGE. INTERNATIONAL JOURNAL OF INNOVATION AND INDUSTRIAL REVOLUTION (IJIREV), [S. l.], v. 7, n. 23, p. 568–592, 2025. DOI: 10.35631/IJIREV.723038. Disponível em: https://gaexcellence.com/ijirev/article/view/6785. Acesso em: 8 jan. 2026.